Testing Byzantine Faults

Byzantine fault is a cumulative term given to the set of both permanent and transient faults caused in circuits which effectively present themselves as different errors at different nodes in the same circuit. Such faults have become significant with the shrinkage in node (process) technology with process variations, radiation strikes and quantummechanical effects being majorly responsible for causing such faults. Such faults not only vary with time but also cause different effects (errors) every time they occur. In this survey we will try to recognize such faults at the circuit level, identify their exact cause and also enumerate their consequences. The survey will also discuss the most efficient byzantine fault model and shares light on probable rectification or preventive scenarios for such faults. We will specifically look into the open-segment byzantine fault model intended for byzantine faults caused due to open interconnects as well evaluate the byzantine faults caused due to the resistive bridging faults and support the corresponding IDDQ test procedures with experimental data.